Our IMS 3f SIMS (Secondary Ion Mass Spectrometry) was one of the earliest instruments from CAMECA’s successful f-series of ion microprobes. We modified various components of the instrument and added our own counting system in order to improve the stability and the signal-to-noise ratio.
The 3f was our workhorse for the measurement of isotopic compositions and trace element abundances for many years. It was dismantled and sold to a refurbishment company in 2014.